Leading semiconductor test equipment supplier\u00a0Advantest Corporation\u00a0(TSE: 6857) will feature its latest semiconductor test solutions at SEMICON Japan 2025, which will be held from Dec. 17-19 at the Tokyo Big Sight in Tokyo, Japan. At this year\u2019s event, Advantest will highlight its broad portfolio of leading-edge test technologies for applications such as AI and high-performance computing (HPC), advanced memory, power electronics, automotive, and wireless communications.<\/p>\n
Product and Solution HighlightsAdvantest\u2019s product display will be located in East Hall 4 at booth #E4346, featuring the company\u2019s comprehensive portfolio of test solutions that address industry challenges in the era of complexity, including:<\/p>\n
Test solutions for agentic AI\/HPC devices, including the\u00a0V93000 EXA Scale SoC test system, the\u00a0HA1200\u00a0die-level handler,\u00a0System-Level Test platforms,\u00a0Advantest Interconnect Solutions (AIS), and the\u00a0SiConic\u00a0solution for automated silicon validation.<\/p>\n
NEW cutting-edge test cell for advanced memory devices, integrating the new\u00a0M5241\u00a0handler that supports high-power, high-density AI memory devices and the\u00a0T5801 Ultra-High-Speed DRAM\u00a0test system.<\/p>\n
NEW mobile and automotive test solutions, including the\u00a0T2000 AiR2X\u00a0air-cooled SoC and power analog test system that supports high-mix, low-volume production while doubling resource density.<\/p>\n
NEW scalable\u00a0MTe test platform, engineered to redefine power semiconductor IC testing. Designed for next-generation wide-bandgap technologies (like SiC and GaN), MTe delivers uncompromising performance: ultra-fast signal capture, precision gate driver control, dynamic and short-circuit testing up to 10kA, flexible high-voltage digital capabilities and a compact footprint.<\/p>\n
Extending the V93000 test system\u2019s capabilities to support high-volume production of silicon photonics and co-packaged optics devices via a\u00a0partnership\u00a0with FormFactor.<\/p>\n
AI-powered test solutions, such as the\u00a0ACS Real-Time Data Infrastructure (ACS RTDI), a solution platform that automates the process of converting insights into actionable production steps within the same test insertion, optimizing yield, improving quality and reducing time to market.<\/p>\n
NEW CD-SEM tools for testing sub-2nm semiconductor photomasks, such as the\u00a0E3660, engineered for the dimensional metrology of photomasks and EUV masks.<\/p>\n
Solutions to enable sustainable practices, such as the\u00a0Advantest Power Optimization Solution (APOS), a software designed to optimize the power management during the V93000 tester\u2019s power-on period.<\/p>\n
SponsorshipLike previous years, Advantest is expressing its steadfast support for the industry as a gold-level sponsor of this year\u2019s SEMICON Japan. Additionally, the company is sponsoring the new Advanced Packaging and Chiplet Summit (APCS), SEMI Technology Symposium (STS), AI x Sustainability x Semiconductor Summit and a student event with Mirai College.<\/p>\n
PresentationsBeyond a product showcase, Advantest will deliver multiple presentations at\u00a0APCS\u00a0and\u00a0STS\u00a0on topics that include AI and HPC, thermal test challenges, advanced packaging and silicon photonics. In addition, Advantest is invited to speak at\u00a0ATS\/ITC-Asia 2025, being held in conjunction with SEMICON Japan.<\/p>\n
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Leading semiconductor test equipment supplier\u00a0Advantest Corporation\u00a0(TSE: 6857) will feature its latest semiconductor test solutions at SEMICON Japan 2025, which will be held from Dec. 17-19 at the Tokyo Big Sight in Tokyo, Japan. At this year\u2019s event, Advantest will highlight its broad portfolio of leading-edge test technologies for applications such…<\/p>\n
The post Advantest to Showcase Latest Test Solutions at SEMICON Japan 2025 in Tokyo<\/a> first appeared on AI-Tech Park<\/a>.<\/p>\n<\/div>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"site-container-style":"default","site-container-layout":"default","site-sidebar-layout":"default","disable-article-header":"default","disable-site-header":"default","disable-site-footer":"default","disable-content-area-spacing":"default","footnotes":""},"categories":[4,1,30,31,32,33],"tags":[3],"class_list":["post-66","post","type-post","status-publish","format-standard","hentry","category-ai","category-ai-and-ml","category-ai-news","category-aitech-news","category-artificial-intelligence-news","category-semicon","tag-ai"],"yoast_head":"\n